Thoughtful delivery service

Easy 30 day returns

Certified Reviews

Description

StrataTek™ Square Mesh GridsDESCRIPTION SIZE SPECIFICATIONS The StrataTek TEM grids for Transmission Electron Microscopy have a thickness of 25m and are manufactured using a micron precision etching process of thin foils. This method produces sturdy and rigid TEM grids. Both sides have the same surface characterization. StrataTek grids have a slightly higher density than grids made by electroplating. Corners where bars meet tend to be rounded. Available in coarser mesh sizes

Note: inset shows tip cross-section

Al Reflective Coating

models BIOFHTR or BIOFHTR-O

monodisperse

SEM/FIB and TEM (with special version)

Max EL = 350 nm

They are designed for use with the Direct Drive Fluid Cantilever Holder and standard Dimension or EnviroScope heads and are available as a replacement part in packages of ten

Complete with anti-static cover and polypropylene clip

Also available with unique

Wide selection of grid styles to support virtually every application with standard diameter of 3

The TG3D-3000/20 test grating with its truly 3-Dimensional structure is intended for simultaneous calibration in X-

Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features

Exchange/Return Notes